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The ‘Enhanced Multi-Materials Analyser’ X-ray Diffractometer incorporating the very latest in design and technology for the Materials Science Industry. The Emma is an enhancement of the successful MMA which offers the same compact size together with even more capabilities.


A non-destructive method for identifying crystalline materials or materials with partial crystalline domains is X-ray Diffraction (XRD). By altering the X-Ray beam’s angle of incidence, an XRD analyzer can produce interference patterns reflecting lattice structures. Thus, the accuracy, rotational speed, and x-ray beam size become crucial criteria for evaluating products.

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